SIMS — Secondary-Ion Mass Spectrometry Imaging L1-143
Unclaimed Principle — open for contribution
This Principle is declared in the catalog but has no reference solver, no pinned dataset, and is not registered on-chain. There is no reward pool. Submitting a cert against this Principle today will record the cert for reproducibility but pay zero PWM.
To claim it as a Bounty #7 contribution: open a PR adding (1) a reference solver, (2) ≥1 dataset pinned to IPFS, (3) updates to the L3 manifest with dataset CIDs. After verifier-agent triple-review, the founders' 3-of-5 multisig signs PWMRegistry.register() and the Principle becomes mineable.
Forward model E
A focused primary-ion beam (Ga+, Bi_n+, C60+, Ar_n+ GCIB) sputters ions from a surface; secondary ions are extracted and mass-analyzed (ToF or magnetic sector) with high mass resolution M/dM > 5000. Image generation by rastering primary beam while counting ions per (m/z, pixel).
L-DAG
Well-posedness W
- Existence:
- true
- Uniqueness:
- peak ID unique for high-res ToF; quantitation requires yield correction
- Stability:
- conditional
- κ:
- 1000
Linear at low primary doses (static SIMS); Dynamic SIMS erodes sample while imaging depth. Matrix ionization-yield varies 1-3 orders of magnitude across analyte environments.
Solvability C
- Solver class:
- Peak integration, PCA / NMF decomposition, MCR-ALS, matrix-effect correction, learned (CNN-SIMS)
- Convergence rate q:
- 2
- Complexity:
- Peak integration O(H*W*N_mz); MCR-ALS O(iter*H*W*K*N_mz)